View source for Engineering:Fourier profilometry

'''Fourier profilometry''' is a method for measuring profiles using distortions in [[Periodic function|periodic]] patterns.  The method uses [[Fourier analysis]] (a 2-[[Physics:Dimension|dimension]]al [[Fast Fourier transform|fast Fourier transform]]) to determine localized [[Slope|slope]]s on a curving [[Surface (mathematics)|surface]].
This allows a ''x'', ''y'', ''z'' [[Curvilinear coordinates|coordinate system]] of the surface to be generated from a single image which has been overlaid with the distortion pattern.

It is used specifically in measuring the shape of the human [[Medicine:Cornea|cornea]] for use in [[Engineering:Contact lens|contact lens]] design.

==References==

[[Category:Optical metrology]]

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