| Display title | Physics:Scanning Kelvin Probe |
| Default sort key | Scanning Kelvin Probe |
| Page length (in bytes) | 21,597 |
| Namespace ID | 3020 |
| Namespace | Physics |
| Page ID | 422424 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of redirects to this page | 0 |
| Counted as a content page | Yes |
| HandWiki item ID | None |
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
| Page creator | imported>John Marlo |
| Date of page creation | 00:32, 26 July 2020 |
| Latest editor | imported>John Marlo |
| Date of latest edit | 00:32, 26 July 2020 |
| Total number of edits | 1 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
Description | Content |
Article description: (description)
This attribute controls the content of the description and og:description elements. | Scanning Kelvin Probe (SKP) is a non-contact, non-destructive Scanning Probe Microscopy (SPM) technique used to measure the work function of the sample under study. By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. It is predominantly... |
