Engineering:PIND

From HandWiki
Revision as of 20:09, 16 December 2020 by imported>Wikisleeper (add)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)

A PIND test is a Particle Impact Noise Detection test. According to method 2020.9 of MIL-STD-883 and method 2052.5 of MIL-STD-750, the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact within the cavity, excite the transducer.

[1] [2]

References

  1. ↑ "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5". Department of Defense. http://www.dscc.dla.mil/downloads/milspec/docs/mil-std-883/std883.pdf. Retrieved 17 December 2015. 
  2. ↑ "TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F". Department of Defense. http://www.landandmaritime.dla.mil/Downloads/MilSpec/Docs/MIL-STD-750/std750part2.pdf. 




Retrieved from "https://handwiki.org/wiki/index.php?title=Engineering:PIND&oldid=328245"