Company:NanoAndMore
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| Type | Private |
|---|---|
| Industry | Nanotechnology |
| Founded | 2002 (Europe), 2005 (USA), 2019 (Japan) |
| Headquarters | Wetzlar, Germany Watsonville, California, USA Misato, Japan |
Number of locations | 3 |
Area served | North America, South America, Europe, Japan |
Key people | Peer A. Burshille (Founder & CEO) Nicholas Schacher (CEO) Nobuhiro Saito (Representative Director) |
| Products | AFM Probes from NanoWorld Nanosensors BudgetSensors MikroMasch Opus nanotools |
| Owner | NanoWorld Holding AG, Switzerland |
| Subsidiaries | NanoAndMore GmbH, Germany NanoAndMore USA Inc., USA Nano And More Japan Co., Ltd., Japan |
| Website | www |
NanoAndMore[1] is a distributor for AFM cantilevers from NanoWorld, Nanosensors, BudgetSensors, MikroMasch, Opus and nanotools, calibration standards and other products for nanotechnology.
History
NanoAndMore was founded in Germany in 2002[2] and started operating in the US in 2005. In 2005, NanoWorld Holding AG from Schaffhausen, Switzerland, acquired and integrated NanoAndMore into the NanoWorld group composed of Nanotechnology companies. The world market leader in AFM probes, NanoWorld has appointed NanoAndMore as the official distributor for NanoWorld and Nanosensors products.[3]
NanoAndMore GmbH is operating from a location in Wetzlar, Germany - serving the European market. NanoAndMore USA is serving the North and South American markets. From 2005 to 2015, NanoAndMore USA was operating from Lady's Island (South Carolina), United States.[4] In 2015, NanoAndMore USA moved to Watsonville, California, United States. NanoAndMore Japan was founded in 2019 and is serving Japan and operating from Misato in Saitama.
Products
AFM probes and accessories distributed by NanoAndMore are used for Atomic Force Microscopy in material science,[5][6][7] physics,[8][9][10] biology,[11] life sciences[12][13] and in semiconductor industry.
AFM probes sold by NanoAndMore fit all common Atomic Force Microscopes (AFM) like Asylum Research, Bruker, JPK, Molecular Imaging, Nanosurf, Veeco, WiTEK, NTMDT, Novascan, etc. As an important distributor of AFM probes it is often cited as a supplier in research papers and is therefore considered an important source of products for Atomic Force Microscopy.[14][15]
References
- ↑ Stefanov, Y.; Ruland, T.; Schwalke, U. (2011). "Electrical AFM Measurements for Evaluation of Nitride Erosion in Shallow Trench Isolation Chemical Mechanical Planarization". MRS Proceedings 838. doi:10.1557/PROC-838-O10.5.
- ↑ "German Handelsregister - NanoAndMore". https://www.online-handelsregister.de/handelsregisterauszug/he/Wetzlar/HRB/5047/NanoAndMore-GmbH#checkout-container.
- ↑ www.nanotech-now.com (1 November 2005). "NanoWorld AG appoints NanoAndMore USA Corp.". http://www.nanotech-now.com/news.cgi?story_id=12616. Retrieved 17 January 2012.
- ↑ "Beaufort's NanoandMore USA One of Three National Finalists in FedEx's Small Business Competition". http://www.savannahbusinessjournal.com/news/67-lowcountry-news/1538-oct-12-beauforts-nanoandmore-one-of-three-national-finalists-in-fedexs-small-business-competition.html. Retrieved 17 January 2012.
- ↑ Martin, P.; Marsaudon, S.; Aimé, J. P.; Bennetau, B. (2005). "Experimental determination of conservative and dissipative parts in the tapping mode on a grafted layer: Comparison with frequency modulation data". Nanotechnology 16 (6): 901. doi:10.1088/0957-4484/16/6/046. Bibcode: 2005Nanot..16..901M.
- ↑ Taubert, A.; Arbell, I.; Mecke, A.; Graf, P. (2006). "Photoreduction of a crystalline Au(III) complex: A solidstate approach to metallic nanostructures". Gold Bulletin 39 (4): 205. doi:10.1007/BF03215555.
- ↑ Toset, J.; Gomila, G. (2010). "Three-dimensional manipulation of gold nanoparticles with electro-enhanced capillary forces". Applied Physics Letters 96 (4): 043117. doi:10.1063/1.3297903. Bibcode: 2010ApPhL..96d3117T.
- ↑ Hoogenboom, B. W.; Frederix, P. L. T. M.; Fotiadis, D.; Hug, H. J.; Engel, A. (2008). "Potential of interferometric cantilever detection and its application for SFM/AFM in liquids". Nanotechnology 19 (38): 384019. doi:10.1088/0957-4484/19/38/384019. PMID 21832578. Bibcode: 2008Nanot..19L4019H.
- ↑ Klapetek, P.; Valtr, M.; Nečas, D.; Salyk, O.; Dzik, P. (2011). "Atomic force microscopy analysis of nanoparticles in non-ideal conditions". Nanoscale Research Letters 6 (1): 514. doi:10.1186/1556-276X-6-514. PMID 21878120. Bibcode: 2011NRL.....6..514K.
- ↑ Gan, Q.; Gao, Y.; Wagner, K.; Vezenov, D.; Ding, Y. J.; Bartoli, F. J. (2011). "Experimental verification of the rainbow trapping effect in adiabatic plasmonic gratings". Proceedings of the National Academy of Sciences 108 (13): 5169–73. doi:10.1073/pnas.1014963108. PMID 21402936. Bibcode: 2011PNAS..108.5169G.
- ↑ Frederix, P. L. T. M.; Bosshart, P. D.; Engel, A. (2009). "Atomic Force Microscopy of Biological Membranes". Biophysical Journal 96 (2): 329–338. doi:10.1016/j.bpj.2008.09.046. PMID 19167286. Bibcode: 2009BpJ....96Q.329F.
- ↑ Hyttel Clausen, C.; Moresco Lange, J.; Boye Jensen, L.; Jaykumar Shah, P.; Ioannou Dimaki, M.; Edith Svendsen, W. (2008). "Scanning conductance microscopy investigations on fixed human chromosomes". BioTechniques 44 (2): 225–228. doi:10.2144/000112676. PMID 18330350.
- ↑ Biswas, A.; Selling, G. W.; Woods, K. K.; Evans, K. (2009). "Surface modification of zein films". Industrial Crops and Products 30: 168–171. doi:10.1016/j.indcrop.2009.02.002. https://naldc-legacy.nal.usda.gov/naldc/download.xhtml?id=31411&content=PDF.
- ↑ www.hessen-nanotech.de. "Nanotechnologie Unternehmen - NanoAndMore GmbH". p. 102. http://www.hessen-nanotech.de/mm/03_Unternehmen_N-Z.pdf. Retrieved 17 January 2012.
- ↑ www.nanoproducts.de. "Katalog - NanoAndMore GmbH - AFM sensoren". http://www.nanoproducts.de/index.php?mp=products&file=info&manufacturers_id=139&products_id=483. Retrieved 17 January 2012.
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