View source for Physics:Energy-dispersive X-ray diffraction

[[Image:EDXRD Schematic.png|thumb|300px|Schematic of a typical EDXRD experiment]]

'''Energy-dispersive X-ray diffraction''' ('''EDXRD''') is an analytical technique for characterizing materials. It differs from conventional X-ray diffraction by using polychromatic photons as the source and is usually operated at a fixed angle.<ref>{{cite journal |last1=Kämpfe |first1=B. |last2=Luczak |first2=F. |last3=Michel |first3=B. |date=2005 |title=Energy Dispersive X-Ray Diffraction |url=https://link.springer.com/article/10.1007/BF02396775 |journal=Part. Part. Syst. Charact. |volume=22 |issue= 6|pages=391–396 |doi=10.1002/ppsc.200501007 |s2cid=97000421 |access-date=March 16, 2014}}</ref> With no need for a [[Physics:Goniometer|goniometer]], EDXRD is able to collect full diffraction patterns very quickly. EDXRD is almost exclusively used with [[Physics:Synchrotron radiation|synchrotron radiation]] which allows for measurement within real engineering materials.<ref>{{cite web |url=http://www.diamond.ac.uk/Beamlines/Engineering-and-Environment/Techniques/EDD.html |title=Energy Dispersive Diffraction |publisher= Diamond Light Source |access-date=March 17, 2014}}</ref>

[[File:Sample data from an EDXRD experiment.pdf|thumb|300px|Sample data from an EDXRD experiment where synchrotron radiation is utilized. Spectra can be generated rapidly and as a function of position or time.]]

== History ==
EDXRD was originally proposed independently by Buras et al. and Giessen and Gordon in 1968.<ref>{{cite journal |last1=Laine |first1=E. |last2=Lähteenmäki |first2=I.  |date=February 1980 |title=The energy dispersive X-ray diffraction method: annotated bibliography 1968–78 |journal=Journal of Materials Science |volume=15 |issue=2 |pages=269–277 |doi=10.1007/BF02396775 |bibcode = 1980JMatS..15..269L |s2cid=189834585 }}</ref>

== Advantages ==
The advantages of EDXRD are (1) it uses a fixed scattering angle, (2) it works directly in reciprocal space, (3) fast collection time, and (4) parallel data collection. The fixed scattering angle geometry makes EDXRD especially suitable for in situ studies in special environments (e.g. under very low or high temperatures and pressures). When the EDXRD method is used, only one entrance and one exit window are needed. The fixed scattering angle also allows for measurement of the diffraction vector directly. This allows for high-accuracy measurement of lattice parameters. It allows for rapid structure analysis and the ability to study materials that are unstable and only exist for short periods of time. Because the whole spectrum of diffracted radiation is obtained simultaneously, it enables parallel data collection studies where structural changes can be determined over time.

== Facilities ==
{| class="wikitable"
|-
! Facility !! Location !! Beamline !! Energy range (keV)
|-
| [[Organization:National Synchrotron Light Source|National Synchrotron Light Source]] || Upton, NY|| X17B1<ref>{{cite web |url=http://beamlines.ps.bnl.gov/beamline.aspx?blid=X17B1 |title=Beamline X17B1 |publisher=[[Organization:Brookhaven National Laboratory|Brookhaven National Laboratory]] |access-date=March 17, 2014 |archive-url=https://web.archive.org/web/20140318061251/http://beamlines.ps.bnl.gov/beamline.aspx?blid=X17B1 |archive-date=March 18, 2014 |url-status=dead }}</ref> || 50–200
|-
| [[Organization:Advanced Photon Source|Advanced Photon Source]] || Argonne, IL || 16-BM-B<ref>{{cite web |url=http://www.aps.anl.gov/Beamlines/Directory/beamline.php?beamline_id=87 |title=Beamline 16-BM-B: Sector 16 – Bending Magnet Beamline |publisher=[[Organization:Argonne National Laboratory|Argonne National Laboratory]] |access-date=March 17, 2014 |archive-url=https://web.archive.org/web/20140318052236/http://www.aps.anl.gov/Beamlines/Directory/beamline.php?beamline_id=87 |archive-date=March 18, 2014 |url-status=dead }}</ref>|| 10–120
|-
| German Electron Synchrotron || Hamburg, DE || P61B<ref>{{cite web |url=https://photon-science.desy.de/facilities/petra_iii/beamlines/p61_high_energy_wiggler_beamline_lvp/p61b_large_volume_press_desy/index_eng.html |title=P61B Large Volume Press (DESY) |publisher=Helmholtz Association |access-date=December 16, 2022}}</ref>||50–150 
|-
| Cornell High Energy Synchrotron Source || Ithaca, NY || B1<ref>{{cite web |url=http://www.chess.cornell.edu/chess/west/B1.htm |title=CHESS West – B1 |publisher=[[Organization:Cornell University|Cornell University]] |access-date=March 17, 2014}}</ref>||unknown 
|-
| [[Organization:Diamond Light Source|Diamond Light Source]] || Oxfordshire, UK || I12<ref>{{cite web |url=http://www.diamond.ac.uk/Home/Beamlines/I12.html |title=I12: Joint Engineering, Environmental, and Processing (JEEP) |publisher=Diamond Light Source |access-date=March 17, 2014}}</ref>|| 50–150
|-
| [[Organization:SOLEIL|SOLEIL]] || Paris, France || I03c<ref>{{cite web |url=http://www.synchrotron-soleil.fr/Recherche/LignesLumiere/PSICHE |title=PSICHÉ beamline |publisher=Synchrotron SOLEIL – L'Orme des Merisiers Saint-Aubin |access-date=March 17, 2014}}</ref> || 15–100
|-
| [[Organization:Indus 2|Indus 2]] || India || BL-11<ref>{{cite journal|last=Pandey|first=K. K.|display-authors=0|title=Energy-dispersive X-ray diffraction beamline at Indus-2 synchrotron source|journal=Pramana|date=April 2013|volume=80|issue=4|pages=607–619|doi=10.1007/s12043-012-0493-0|bibcode = 2013Prama..80..607P |s2cid=122303528}}</ref>|| unknown
|}

==References==
{{reflist}}

{{DEFAULTSORT:X-Ray Crystallography}}
[[Category:Diffraction]]
[[Category:Synchrotron-related techniques]]



{{Sourceattribution|Energy-dispersive X-ray diffraction}}