Engineering:Critical area (computing)
From HandWiki
In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure.[1] It measures the sensitivity of the circuit to a reduction in yield.[2]
The critical area [math]\displaystyle{ (A_c) }[/math] on a single layer integrated circuit design is given by:
- [math]\displaystyle{ A_c =\int_{0}^{\infty} A(r)D(r)dr }[/math]
where [math]\displaystyle{ A(r) }[/math] is the area in which a defect of radius [math]\displaystyle{ r }[/math] will cause a failure, and [math]\displaystyle{ D(r) }[/math] is the density function of said defect.[3]
References
- ↑ D. M. H. Walker (1992). "Critical area analysis". [1992] Proceedings International Conference on Wafer Scale Integration. IEEE. pp. 281–290. doi:10.1109/ICWSI.1992.171820. ISBN 0-8186-2482-5. https://ieeexplore.ieee.org/document/171820.
- ↑ A. V. Ferris-Prabhu (1985). "Modeling the critical area in yield forecasts". IEEE Journal of Solid-State Circuits (IEEE) 20 (4): 874–878. doi:10.1109/JSSC.1985.1052403. Bibcode: 1985IJSSC..20..874F. https://ieeexplore.ieee.org/document/1052403.
- ↑ Papadopoulou, Evanthia (2000). "Critical area computation for missing material defects in VLSI circuits". Proceedings of the 2000 international symposium on Physical design. pp. 140–146. doi:10.1145/332357.332390. ISBN 1581131917.
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