Physics:Coherence scanning interferometry

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Coherence scanning interferometry (CSI) is any of a class of optical surface measurement methods wherein the localization of interference fringes during a scan of optical path length provides a means to determine surface characteristics such as topography, transparent film structure, and optical properties. CSI is currently the most common interference microscopy technique for areal surface topography measurement.[1] The term "CSI" was adopted by the International Organization for Standardization (ISO).[2]

Characteristic CSI signal

The technique encompasses but is not limited to instruments that use spectrally broadband, visible sources (white light) to achieve interference fringe localization. CSI uses either fringe localization alone or in combination with interference fringe phase, depending on the surface type, desired surface topography repeatability and software capabilities. The table below compiles alternative terms that conform at least in part to the above definition.

Acronym Term Reference
CSI Coherence scanning interferometry [3]
CPM Coherence probe microscope [4]
CSM Coherence scanning microscope [5]
CR Coherence radar [6]
CCI Coherence correlation interferometry [7]
MCM Mirau correlation microscope [8]
WLI White light interferometry [9]
WLSI White light scanning interferometry [10]
SWLI Scanning white light interferometry [11]
WLS White Light Scanner
WLPSI White light phase shifting interferometry [12]
VSI Vertical scanning interferometry [13]
RSP Rough surface profiler [14]
IRS Infrared scanning [15]
OCT Full-field optical coherence tomography [16]

References

  1. ↑ de Groot, P (2015). "Principles of interference microscopy for the measurement of surface topography". Advances in Optics and Photonics 7 (1): 1–65. doi:10.1364/AOP.7.000001. Bibcode: 2015AdOP....7....1D. 
  2. ↑ ISO (2013). 25178-604:2013(E): Geometrical product specification (GPS) – Surface texture: Areal – Nominal characteristics of non-contact (coherence scanning interferometric microscopy) instruments (2013(E) ed.). Geneva: International Organization for Standardization.
  3. ↑ Windecker, R.; Haible, P.; Tiziani, H. J. (1995). "Fast Coherence Scanning Interferometry for Measuring Smooth, Rough and Spherical Surfaces". Journal of Modern Optics 42 (10): 2059–2069. doi:10.1080/09500349514551791. Bibcode: 1995JMOp...42.2059W. 
  4. ↑ Davidson, M.; Kaufman, K.; Mazor, I. (1987). "The Coherence Probe Microscope". Solid State Technology 30 (9): 57–59. 
  5. ↑ Lee, B. S.; Strand, T. C. (1990). "Profilometry with a coherence scanning microscope". Appl Opt 29 (26): 3784–3788. doi:10.1364/ao.29.003784. PMID 20567484. Bibcode: 1990ApOpt..29.3784L. 
  6. ↑ Dresel, T.; Häusler, G.; Venzke, H. (1992). "Three-dimensional sensing of rough surfaces by coherence radar". Applied Optics 31 (7): 919–925. doi:10.1364/ao.31.000919. PMID 20720701. Bibcode: 1992ApOpt..31..919D. 
  7. ↑ Lee-Bennett, I. (2004). Advances in non-contacting surface metrology. Optical Fabrication and Testing, OTuC1.
  8. ↑ Kino, G. S.; Chim, S. S. C. (1990). "Mirau correlation microscope". Applied Optics 29 (26): 3775–83. doi:10.1364/ao.29.003775. PMID 20567483. Bibcode: 1990ApOpt..29.3775K. 
  9. ↑ Larkin, K. G. (1996). "Efficient nonlinear algorithm for envelope detection in white light interferometry". Journal of the Optical Society of America A 13 (4): 832. doi:10.1364/josaa.13.000832. Bibcode: 1996JOSAA..13..832L. 
  10. ↑ Wyant, J. C. (September, 1993). How to extend interferometry for rough-surface tests. Laser Focus World, 131-135.
  11. ↑ Deck, L.; de Groot, P. (1994). "High-speed noncontact profiler based on scanning white-light interferometry". Applied Optics 33 (31): 7334–7338. doi:10.1364/ao.33.007334. PMID 20941290. Bibcode: 1994ApOpt..33.7334D. 
  12. ↑ Schmit, J.; Olszak, A. G. (2002). Creath, Katherine; Schmit, Joanna. eds. "Challenges in white-light phase-shifting interferometry". Proc. SPIE. Interferometry XI: Techniques and Analysis 4777: 118–127. doi:10.1117/12.472211. Bibcode: 2002SPIE.4777..118S. 
  13. ↑ Harasaki, A.; Schmit, J.; Wyant, J. C. (2000). "Improved vertical-scanning interferometry". Applied Optics 39 (13): 2107–2115. doi:10.1364/ao.39.002107. PMID 18345114. Bibcode: 2000ApOpt..39.2107H. 
  14. ↑ Caber, P. J. (1993). "Interferometric profiler for rough surfaces". Appl Opt 32 (19): 3438–3441. doi:10.1364/ao.32.003438. PMID 20829962. Bibcode: 1993ApOpt..32.3438C. 
  15. ↑ De Groot, P.; Biegen, J.; Clark, J.; Colonna; de Lega, X.; Grigg, D. (2002). "Optical Interferometry for Measurement of the Geometric Dimensions of Industrial Parts". Applied Optics 41 (19): 3853–3860. doi:10.1364/ao.41.003853. PMID 12099592. Bibcode: 2002ApOpt..41.3853D. 
  16. ↑ Dubois, A; Vabre, L; Boccara, AC; Beaurepaire, E (2002). "High-resolution full-field optical coherence tomography with a Linnik microscope". Applied Optics 41 (4): 805–12. doi:10.1364/ao.41.000805. PMID 11993929. Bibcode: 2002ApOpt..41..805D. 




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