Category:Electronic engineering

A

• ► Analog circuits‎ (4 C, 119 P)

B

• ► Broadcast engineering‎ (6 C, 278 P)

D

• ► Digital electronics‎ (5 C, 164 P)
• ► Display technology‎ (7 C, 228 P)
• ► Distributed element circuits‎ (28 P)

E

• ► Electrical circuits‎ (1 C, 53 P)
• ► Electronic circuits‎ (6 C, 100 P)
• ► Electronic design‎ (4 C, 177 P)

F

• ► Flexible electronics‎ (17 P)

H

• ► Hardware description languages‎ (42 P)

N

• ► Network access‎ (3 C, 47 P)

P

• ► Power electronics‎ (2 C, 41 P)
• ► Printed circuit board manufacturing‎ (2 C, 78 P)

S

• ► Semiconductors‎ (7 C, 69 P)

V

• ► Video hardware‎ (3 C, 35 P)

• Electronic engineering (computing)

*

• Universal dielectric response (physics)

A

• Analog device (engineering)
• Analogue electronics (engineering)
• Angle notation (engineering)
• Arc fault (engineering)
• Autodyne (engineering)
• Avionics (engineering)

B

• Basing diagram (computing)
• Biasing (engineering)
• Bipolar transistor biasing (engineering)
• Bootstrapping (electronics) (engineering)
• Bridging fault (engineering)

C

• Center for Advancing Electronics Dresden (organization)
• Chamfer (engineering)
• Circuit design (engineering)
• Circuit extraction (engineering)
• Electronic color code (engineering)
• Communications-electronics (engineering)
• Compact Model Coalition (engineering)
• Computer module (engineering)
• Contact pad (engineering)
• Convia (company)
• Current–voltage characteristic (physics)

D

• Dark current (engineering)
• Design closure (engineering)
• Device under test (engineering)
• Diagnostic board (engineering)
• Double subscript notation (computing)

E

• EKV MOSFET model (engineering)
• Electric power conversion (engineering)
• Electrical engineering (computing)
• Electromagnetic field solver (engineering)
• Electronic circuit (physics)
• Electronic design automation (engineering)
• Electronic hardware (engineering)
• Electronic oscillation (engineering)
• Electronic paper (engineering)
• Electronic speed control (engineering)
• Electronic symbol (computing)
• Elmore delay (engineering)
• Endec (engineering)
• Energy efficient transformer (physics)
• Enterprise test software (computing)
• ESD simulator (engineering)

F

• Fault coverage (engineering)
• Field-replaceable unit (engineering)
• Flexible electronics (engineering)
• Flexible organic light-emitting diode (chemistry)
• Flip-flop (electronics) (engineering)
• Footprint (electronics) (engineering)
• Franz–Keldysh effect (engineering)
• Functional testing (manufacturing) (engineering)
• Fuzzy electronics (computing)

G

• Glossary of electrical and electronics engineering (engineering)
• Ground bounce (physics)
• Gyrator–capacitor model (engineering)

H

• Hardware watermarking (computing)
• High-κ dielectric (engineering)
• Highly accelerated life test (engineering)
• Highly accelerated stress audit (computing)

I

• IEC 61108 (computing)
• IEC 61131 (computing)
• IEC 61162 (computing)
• IEEE 1451 (computing)
• Impulse generator (engineering)
• Inductive coupling (engineering)
• Institute of Electronics, Information and Communication Engineers (organization)
• Institution of Electronics and Telecommunication Engineers (organization)
• Integrated circuit design (engineering)
• IP-XACT (computing)

J

• Johnson–Nyquist noise (physics)

K

• Küpfmüller's uncertainty principle (engineering)

L

• LAVIS (software)
• Lee algorithm (engineering)
• Line (electrical engineering) (engineering)
• Line level (physics)
• Load profile (physics)
• Logic optimization (computing)
• Logic redundancy (computing)
• Logic synthesis (computing)

M

• Mason's invariant (engineering)
• Mass action law (electronics) (engineering)
• Mathematical methods in electronics (computing)
• Maze runner (engineering)
• Measuring moisture content using time-domain reflectometry (computing)
• TDR moisture sensor (computing)
• Memory cell (computing) (computing)
• Mesh analysis (engineering)
• Microvia (engineering)
• MPLAB devices (engineering)
• Multi-project wafer service (engineering)

N

• Nanoprobing (engineering)
• Negative-bias temperature instability (engineering)
• Noise margin (engineering)
• Noise-domain reflectometry (engineering)
• Non-Quasi Static model (engineering)

O

• Ohm's law (physics)
• Open-circuit time constant method (engineering)
• Operating point (engineering)

P

• Positive-real function (computing)
• Potentiostat (engineering)
• Pre-charge (engineering)
• Printed circuit board (engineering)
• Product engineering (engineering)
• Programmable load (engineering)

Q

• Quality intellectual property metric (engineering)

R

• Radio-frequency engineering (engineering)
• Reference designator (engineering)
• Reflection coefficient (computing)
• Reflectometry (engineering)
• Ridley–Watkins–Hilsum theory (engineering)

S

• Safe operating area (engineering)
• Shift register lookup table (computing)
• Smart onboard data interface module (astronomy)
• Sooraj Surendran (biography)
• Source transformation (engineering)
• Spread-spectrum time-domain reflectometry (engineering)
• Spurious tone (physics)
• Stamped circuit board (engineering)
• Standard Commands for Programmable Instruments (engineering)
• Stretchable electronics (engineering)
• Substrate coupling (engineering)
• Synchronous detector (engineering)
• System analysis (computing)

T

• Terminal (electronics) (engineering)
• Test compression (engineering)
• Thermal resistance (physics)
• Thermal runaway (astronomy)
• Time domain vernier method (engineering)
• Time stretch analog-to-digital converter (physics)
• Time stretch quantitative phase imaging (biology)
• Time-domain reflectometry (engineering)
• Time-stretch analog-to-digital converter (physics)
• Titanium oxide (chemistry)
• Topology (electrical circuits) (engineering)
• Transistor model (engineering)
• Transparent heating film (engineering)
• Trojan wave packet (physics)

U

• Undervoltage-lockout (physics)
• Uniform field theory (computing)

V

• VESC (engineering)
• Virtual instrumentation (engineering)

W

• Whisker (metallurgy) (engineering)

Y

• Y-factor (physics)